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ePub ESD: Design and Synthesis download

by Steven H. Voldman

ePub ESD: Design and Synthesis download
Author:
Steven H. Voldman
ISBN13:
978-0470685716
ISBN:
0470685719
Language:
Publisher:
Wiley; 1 edition (April 25, 2011)
Category:
Subcategory:
Engineering
ePub file:
1940 kb
Fb2 file:
1703 kb
Other formats:
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Rating:
4.4
Votes:
236

This book studies electrical overstress, ESD, and latchup from a whole-chip ESD design synthesis approach

This book studies electrical overstress, ESD, and latchup from a whole-chip ESD design synthesis approach. It provides a clear insight into the integration of ESD protection networks from a generalist perspective, followed by examples in specific technologies, circuits, and chips. Uniquely both the semiconductor chip integration issues and floorplanning of ESD networks are covered from a top-down' design approach. Electrostatic discharge (ESD) continues to impact semiconductor components and systems as technologies scale from micro- to nano-electronics. This book studies electrical overstress, ESD, and latchup from a whole-chip ESD design synthesis approach.

Books Pdf Electrical Engineering Electrostatic Discharge ESD Design and Synthesis by Steven H. Voldman. Tags: Electrostatic Discharge Electrostatic Discharge Books Electrostatic Discharge in Electronics ESD ESD BASICS ESD Design ESD Electronics Semiconductor.

Engineering Books Pdf Electrical Engineering Electrostatic Discharge ESD Design and Synthesis by Steven H. ESD Design and Synthesis by Steven H.

In ESD design synthesis, ESD networks can lead to CMOS latchup. Ballasting is utilized to both limit and distribute the ESD current within a circuit element. Do you want to read the rest of this chapter?

In ESD design synthesis, ESD networks can lead to CMOS latchup. Do you want to read the rest of this chapter? Request full-text. Citations (3). References (68). Electrostatic discharge (ESD) is a common form of component-level failure from manufacturing, shipping, and handling in an ASIC environment. Two of the tests used in the qualification and release process of an ASIC design system are the.

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This book studies electrical overstress, ESD, and latchup from a whole-chip ESD design synthesis approach.

Authors: Steven H Voldman

Authors: Steven H Voldman. Get what you need ― fast! How much does ShippingPass cost?

Khon Kaen University. Dr. Voldman was chairman of the SEMATECH ESD Working Group, from 1995 to 2000. Voldman also has written an articles for Scientific American and is an author of the first book series on ESD and latchup: ESD: Physics and Devices, ESD:Circuits and Devices, ESD: Radio Frequency (RF) Technology and Circuits, a fourth text, Latchup, and a fifth text, ESD: Failure Mechanisms and Models, and a sixth book ESD: Design and Synthesis, a seventh book ESD.

ESD Series By Steven H. ESD Basics: From Semiconductor Manufacturing to Product Use ISBN: 9780470979716 September 2012. ESD: Design and Synthesis ISBN: 9780470685716 March 2011. ESD: Failure Mechanisms and Models ISBN: 9780470511374 July 2009. Latchup ISBN: 9780470016428.

Esd: Design and Synthesis. It provides a clear insight into the integration of ESD protection networks from . More).

ESD: Design and Synthesis Voldman Wiley 9780470685716 : Electrostatic discharge (ESD) continues to impact . This book studies electrical overstress, ESD, and latchup from awhole-chip ESD design synthesis approach.

ESD: Design and Synthesis Voldman Wiley 9780470685716 : Electrostatic discharge (ESD) continues to impact nts and systems as technologies scale from micro- tonano-electroni. It provides a clearinsight into the integration of ESD protection networks from ageneralist perspective, followed by examples in, circuits, and chips. Uniquely both the semiconductorchip integration issues and floorplanning of ESD networks arecovered from a top-down design approach. Look inside for extensive coverage on

Electrostatic discharge (ESD) continues to impact semiconductorcomponents and systems as technologies scale from micro- tonano-electronics.

This book studies electrical overstress, ESD, and latchup from awhole-chip ESD design synthesis approach. It provides a clearinsight into the integration of ESD protection networks from ageneralist perspective, followed by examples in specifictechnologies, circuits, and chips. Uniquely both the semiconductorchip integration issues and floorplanning of ESD networks arecovered from a ‘top-down' design approach.

Look inside for extensive coverage on:

integration of cores, power bussing, and signal pins in DRAM,SRAM, CMOS image processing chips, microprocessors, analogproducts, RF components and how the integration influences ESDdesign and integrationarchitecturing of mixed voltage, mixed signal, to RF design forESD analysisfloorplanning for peripheral and core I/O designs, and theimplications on ESD and latchupguard ring integration for both a ‘bottom-up' and‘top-down' methodology addressing I/O guard rings, ESD guardrings, I/O to I/O, and I/O to coreclassification of ESD power clamps and ESD signal pincircuitry, and how to make the correct choice for a givensemiconductor chipexamples of ESD design for the state-of-the-art technologiesdiscussed, including CMOS, BiCMOS, silicon on insulator (SOI),bipolar technology, high voltage CMOS (HVCMOS), RF CMOS, and smartpowerpractical methods for the understanding of ESD circuit powerdistribution, ground rule development, internal bus distribution,current path analysis, quality metrics

ESD: Design and Synthesis is a continuation of theauthor's series of books on ESD protection. It is an essentialreference for: ESD, circuit, and semiconductor engineers; designsynthesis team leaders; layout design, characterisation,floorplanning, test and reliability engineers; technicians; andgroundrule and test site developers in the manufacturing and designof semiconductor chips.

It is also useful for graduate and undergraduate students inelectrical engineering, semiconductor sciences, and manufacturingsciences, and on courses involving the design of ESD devices, chipsand systems. This book offers a useful insight into the issues thatconfront modern technology as we enter the nano-electronic era.