Secondary Ion Mass Spectrometry is a state-of-the-art book, thorough-going and complete. Series: Chemical Analysis: A Series of Monographs on Analytical Chemistry and Its Applications (Book 138).

Secondary Ion Mass Spectrometry is a state-of-the-art book, thorough-going and complete. Analytical chemists will find it an invaluable reference and handbook. Hardcover: 1264 pages.

Benninghoven, . Rudenauer. In their preface, the authors note that no comprehensive treatment of secondary-ion mass spectrometry exists and that this book was written to correct the omission. Drawing on a total of over 75 years of experience with the method, these three authors have assembled a monumental work that belongs on the desk of every mass spectroscopist and every surface scientist

Secondary Ion Mass Spectrometry is a major contribution to the incipient literature on SIMS, and the most thorough presentation yet of this analytical technique.

Secondary Ion Mass Spectrometry is a major contribution to the incipient literature on SIMS, and the most thorough presentation yet of this analytical technique. Secondary Ion Mass Spectrometry is suitable as both an introduction and an advanced handbook.

Recently the advan tages of using mass spectrometry in comprehensive liquid chromatography (LC X LC system) have been discussed and different applications have been described for pharmaceutical compounds (Donato et a. 2012).

Static secondary-ion mass spectrometry, or static SIMS is a secondary ion mass spectrometry technique for chemical analysis including elemental composition and chemical structure of the uppermost atomic or molecular layer of a solid which may be a m. .

Static secondary-ion mass spectrometry, or static SIMS is a secondary ion mass spectrometry technique for chemical analysis including elemental composition and chemical structure of the uppermost atomic or molecular layer of a solid which may be a metal, semiconductor or plastic with insignificant disturbance to its composition and structure.

The Saha-Boltzmann analysis of spectra for medium energy level (1050 mJ) yields plasma temperatures of (3881 ± 200) K and (26,047 ± 200) K for Fe I and OV as the . DNA Vaccines Approach: From Concepts to Applications.

The Saha-Boltzmann analysis of spectra for medium energy level (1050 mJ) yields plasma temperatures of (3881 ± 200) K and (26,047 ± 200) K for Fe I and OV as the lowest and highest temperatures respectively. A range of corresponding electron density (Ne-) of (. 7 - . 0) 1020, (. 8 - . 0) 1020 and (. 9 - . 6) 1020 cm-3were determined at 860, 1050 and 1260 mJ respectively using the estimated CCD pictures. The results confirmed a higher elements ratio for S1 than S2 and the signal intensity indicated a non-linear behaviour as a function of pulse frequency with the maximum ratio value.

Seco ndary Ion Mass Spectrometry Basic Concepts, Instrumental Aspects, Applications and Trends (Volume 86 in Chemical Analysis: A Series of Monographs on Analytical Chemistry and Its Applications) A. Benninghoven, F. G. Rüdenauer, and H. W. Werner "[This. Werner " is (and probably will be for a long time ahead) the standard book on secondary ion mass spectrometry. Trends in Analytical Chemistry "This is a monumental work, and contains nearly 600 illustrations and over 2,000 references covering nearly all the essential published information up to 1985.

Part of the NATO Science Series book series (NSSE, volume 364). Bennighoven, A, Rudenauer, . 1987) Secondary Ion Mass Spectrometry; Basic Concepts, Instrumental Aspects, Applications and Trends, Wiley, New York. More and more, our understanding of surface structure and chemical composition is becoming fundamental in materials development. 7. Joshi, A, Davis, . 1975) Auger Electron Spectroscopy, in AW. Czanderna (e., Method of Surface Analysis, Elsevier, Amsterdam, pp. 159–222.

Secondary Ion Mass Spectrometry: Basic Concepts, Instrumental Aspects, Applications, and Trends, by A. Rudenauer, and H. Werner, Wiley, New York, 1987 (1227 pages). Applications from the University of Wisconsin SIMS lab: Page FZ, Ushikubo T, Kita NT, Riciputi LR, Valley JW (2007) High precision oxygen isotope analysis of picogram samples reveals μm gradients and slow diffusion in zircon.

Applications Early MS work on the analysis of polymer additives has .

Applications Early MS work on the analysis of polymer additives has focused on the use of El, Cl, and GC-MS. The major drawback to these methods is that they are limited to thermally stable and relatively volatile compounds and therefore are not suitable for many high-MW polymer additives. Applications of Secondary Ion Mass Spectrometry (SIMS) in Materials Science. J. Material Sc. 41(2006) 873-903. Benninghoven A, Rudenauer F G and Werner H W 1987 Secondary Ion Mass Spectrometry, Basic Concepts, Instrumental Aspects, Applications and Trends (New York Wiley).